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WATOM - Wafer Edge Profile Measurement

The wafer edge profiler WATOM from KoCoS sets the worldwide benchmark for the quality assurance and process control of edge grinding and polishing process combining the highest quality standards with top-class service.

The patent laser technology measures the edge profile not only on any point of the circumference even so inside the notch. Leading wafer manufacturer across the world use WATOM as their state-of–the art tool for geometrical measurement of wafer edge.

Edge Profile Grinding Process Control

WATOM LS is your choice to control your wafer edge profile grinding process for a broad range of substrate types and sizes including silicon, silicon carbide, gallium arsenide, germanium glass, sapphire and others.

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Edge Profile Polishing Process Control

WATOM CCD is your choice to control your wafer edge profile polishing process for a broad range of substrate types and sizes including silicon, silicon carbide, gallium arsenide, germanium, glass, sapphire and others.

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Edge Profile Measuring in Lab

WATOM T is your choice for wafer edge profile measurement for low volume and cost saving solutions.
The space-saving table-top tool for integration in small productions and for sample test requirements.

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WATOM LS

WATOM LS
Wafer Edge Measurement - pinpoint precise


The use of smaller and smaller patterns in the semiconductor industry calls for increasingly advanced materials of extremely high quality. In response to the steady improvements in the quality of wafers, KoCoS Optical Measurement has developed WATOM, a wafer edge and notch profile measurement tool which heralds a new era of extremely precise wafer geometry measurement.

The patented measurement method of WATOM LS utilizes a lightsectioning sensor to measure the profile of the wafer edge with pinpoint precision, including the profile within the notch. Using a CMOS camera, pictures are taken of the laser line produced by the edge profile. A mathematical algorithm developed by KoCoS is then used to determine the edge profile characteristics.
The modular design of WATOM is prepared to be combined with various automation solutions for modern semiconductor manufacturing processes, whether individual wafers are loaded manually or an automated material handling system (AMHS) is in place.
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WATOM CCD

 

WATOM CCD
Wafer Edge Measurement –

Reliable Projection Technology

WATOM CCD uses profile projection technology as an alternative to the LS technology and provides the ideal solution for less demanding profile measurement requirements, in particular when notch measurement is not required. A CMOS camera captures the profile image of the wafer edge illuminated by a telecentric light source.

The modular design of WATOM is prepared to be combined with various automation solutions for modern semiconductor manufacturing processes, whether individual wafers are loaded manually or an automated material handling system (AMHS) is in place.
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WATOM T

 

WATOM T

Small footprint and consistent accuracy
WATOM T is a compact, inexpensive alternative for applications that have no automation requirements and provides the same quality, process reliability and measurement precision as other WATOM systems.

WATOM T is designed to accept two wafer sizes for quick sample measurement.

Equipped with a touch screen, this tool is easy to use for operators, experts and maintenance staff alike.
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