PRODUCTS & SOLUTIONS
- Measuring and Test Systems
- Engineering Services
- Catalytic Converter Measurement
- Wafer Edge Profile Measurement
- Vacuum Inspection
- Training Courses
The SmartSequencer can be used to create any kind of test run. A test run is similar to a test sequence in the VD-Monitor, which can consist of a number of static and dynamic signal characteristics. However, in the VD-Monitor the individual characteristics (also termed states) have a fixed, pre-defined length and are run sequentially one after the other.
Using the SmartSequencer it is possible to "run" these states in an event-controlled manner. A different progression condition (transition) can be defined for each state. This might be the reaction of the device under test (test object) in the form of a binary signal or alternatively a defined time, for example.
It is even possible to define several transitions for one state. This makes it possible to implement comprehensive test runs with branches and loops. The SmartSequencer thus provides an easy means of testing complex protective functions such as automatic reclosing (ARC).